Collection: AMAG7 Test Wafers

AMAG7

The AMAG7 reticle is a comprehensive new advanced metrology patterning reticle and test pattern collection, derived from SEMATECH AMAG’s AMAG4/5/6 and modernized to today’s metrology and processing community’s needs. AMAG7 makes available short-loop wafers with the comprehensive AMAG7 patterned into various modern process levels at a contemporary foundry to make available leading-edge, mission-critical yet IP-neutral test samples/artifacts for metrology or processing R&D needs.

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