SimuSEM Use Cases
hop SimuSEM Software Intro Charging Videos
SimuSEM is very flexible, capable of valuable simulation support in many roles:
- Virtual metrology / application exploration & understanding
- Metrology Gaps / Limits / Feasibility studies
- Fundamental understanding of signal generation
- Model Based Metrology algorithm development
- Hybrid metrology comparisons involving SEM
- Faux image generation for AI training
- SEM imaging condition optimization
- Calibration of analytical models
- HV-SEM/Overlay exploration
- Ability to quantitatively study detailed profile influences on SEM signal, or any/all of the stochastic components involved in roughness measurement, key industry knowledge gaps
Key Use Case: Cost Reduction of Metrology and Inspection Ownership
Organizations using SimuSEM can achieve an increase in metrology/inspection throughput, reduction of production cycle-time, and an overall improvement in process control by optimizing current metrology and inspection recipes. SimuSEM is a virtual SEM that can improve metrology and defect inspection by resolving issues, optimizing, and assisting with new recipe creations without adding to cycle time, for a small fraction of the cost of the purchase of another metrology tool.

Papers
- ASMC 2024: Coming of Age in Computational SEM
- SPIE 2024:Â Â Simulating SEM imaging of via bottoms
- SPIE 2023:Â Â Simulating HV-SEM imaging of HAR and buried features
- SPIE 2022:Â Â Simulating Process Subtleties in SEM Imaging
Presentations
- ASMC 2024:Â Coming of Age in Computational SEM
- Video: SimuSEM GUI
- Video: Buried grating overlayer
- Video: SimuSEM runtime
- Video: HAR profile setup
- Video: ONO IDA
- SPIE 2024:Â Â Simulating SEM imaging of via bottoms
- Video: Via Bottom Setup
- SPIE 2024:Â Â Quantitative analysis of cross-section SEM spatial distortion artifacts
- SPIE 2023:Â Â Simulating HV-SEM imaging of HAR and buried features
- SPIE 2022:Â Â Simulating Process Subtleties in SEM Imaging